Overview
The iSpecField-UVIR Educational Full-Range Field Spectroradiometer family is designed for teaching, applied research, and field spectroscopy. The three configurations cover 300-1700 nm or 200-2500 nm for remote sensing, soil analysis, mineral exploration, geological research, and vegetation studies.
A fixed holographic grating supports fast full-spectrum acquisition. Depending on the model, synchronized CMOS or BT-CCD and InGaAs detectors provide visible, near-infrared, and shortwave-infrared measurements. TEC-cooled configurations use infrared thermal pixel-drift correction to improve stability when temperatures change.
The pistol-grip fiber-optic probe supports handheld reflectance measurements in the field. LiSpecView handles acquisition, while SpecAnalysis provides spectral processing, ENVI-compatible workflows, the USGS spectral library, and 41 vegetation indices including NDVI.
Typical Applications
Key Features
- Full-range coverage: The model family spans 200-2500 nm for visible, near-infrared, and shortwave-infrared measurement.
- Dual-detector acquisition: Synchronized BT-CCD or CMOS and InGaAs channels support wavelength accuracy and spectral resolution across the available ranges.
- Handheld reflectance measurement: The pistol-grip probe supports practical laboratory exercises and field data collection.
- Spectral analysis software: SpecAnalysis supports third-party data workflows, the USGS spectral library, and vegetation-index analysis.
Model Configurations
The iSpecField-UVIR-1.7 covers 300-1700 nm with a CMOS and InGaAs detector pair. The iSpecField-UVIR-1.7TEC adds TEC-cooled BT-CCD and InGaAs detectors for the same wavelength range. The iSpecField-UVIR-2.5TEC extends coverage to 200-2500 nm with TEC-cooled detectors.
SpecAnalysis Spectral Data Processing
SpecAnalysis displays and compares measured spectra, stores field metadata, and supports post-processing for remote-sensing and vegetation applications. The software works with LiSpecView acquisition data and supports ENVI-compatible export.
Parameter
Technical Specifications
| Parameter | iSpecField-UVIR-1.7 | iSpecField-UVIR-1.7TEC | iSpecField-UVIR-2.5TEC |
|---|---|---|---|
| Product Image |
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| Wavelength Range | 300–1700 nm | 300–1700 nm | 200–2500 nm |
| Wavelength Accuracy | ±1 nm | ±1 nm | ±1 nm |
| Wavelength Repeatability | ±1 nm | ±0.5 nm | ±0.5 nm |
| Spectral Resolution | ≤4 nm @ 300–1000 nm ≤7 nm @ 1000–1700 nm | ≤3 nm @ 300–1000 nm ≤6 nm @ 1000–1700 nm | ≤3 nm @ 300–1000 nm ≤10 nm @ 1000–2500 nm |
| Number of Spectral Channels | 1400 | 1400 | 2200 |
| Wavelength Sampling Interval | 1 nm @ 300–1700 nm | 1 nm @ 300–1700 nm | 1 nm @ 300–2500 nm |
| Detector | 2048-pixel CMOS 256-element InGaAs | 2048-pixel area-array BT-CCD 256-element TEC-cooled InGaAs | 2048-pixel area-array BT-CCD 256-element TEC-cooled InGaAs |
| Noise-Equivalent Radiance | 1.0 × 10⁻⁸ W/cm²/nm/sr @ 700 nm 8.0 × 10⁻⁸ W/cm²/nm/sr @ 1500 nm | 1.0 × 10⁻⁹ W/cm²/nm/sr @ 700 nm 8.0 × 10⁻⁹ W/cm²/nm/sr @ 1500 nm | 1.2 × 10⁻⁹ W/cm²/nm/sr @ 400 nm 1.0 × 10⁻⁹ W/cm²/nm/sr @ 700 nm 1.2 × 10⁻⁹ W/cm²/nm/sr @ 1500 nm 5.8 × 10⁻⁹ W/cm²/nm/sr @ 2100 nm |
| Scanning Mode | Fixed Holographic Grating | Fixed Holographic Grating | Fixed Holographic Grating |
| Minimum Integration Time | ≥100 μs | ≥100 μs | ≥100 μs |
| Maximum Measurable Radiance | VNIR: Up to 20× Solar Irradiance; SWIR: Up to 100× Solar Irradiance | VNIR: Up to 20× Solar Irradiance; SWIR: Up to 100× Solar Irradiance | VNIR: Up to 20× Solar Irradiance; SWIR: Up to 100× Solar Irradiance |
| Data Acquisition Method | Pistol-Grip Fiber-Optic Probe | Pistol-Grip Fiber-Optic Probe | Pistol-Grip Fiber-Optic Probe |
| Spectral Software | LiSpecView Spectral Acquisition Software; SpecAnalysis Spectral Data Processing and Analysis Software | LiSpecView Spectral Acquisition Software; SpecAnalysis Spectral Data Processing and Analysis Software | LiSpecView Spectral Acquisition Software; SpecAnalysis Spectral Data Processing and Analysis Software |
